Item #: 1120036 | Model #: 9783642311482
Pattern Recognition: 4th Mexican Conference
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Pattern Recognition: 4th Mexican Conference

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Product Details
  • Author Name: Jesus Ariel Carrasco-Ochoa Inst. Nacional de Astrofisica, Jose Francisco Martinez-Trinidad, Jose Arturo Olvera Lopez, Kim L. Boyer
  • No of Pages: 346 Pages
  • Publisher: Springer
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79.99
79.99
https://www.staples-3p.com/s7/is/image/Staples/m001244598
09783642311482
Springer-Verlag New York Inc
Pattern Recognition: 4th Mexican Conference
Product Description
Pattern Recognition: 4th Mexican Conference by Kim L. Boyer et. al - Contains selected submissions on pattern recognition and neural networks

Pattern Recognition: 4th Mexican Conference by Kim L. Boyer et. al contains the arbitrated reports of the 4th Mexican Conference on Pattern Recognition, MCPR 2012, held in Huatulco, Mexico, in June 2012.

  • Author Name: Jesus Ariel Carrasco-Ochoa Inst. Nacional de Astrofisica, Jose Francisco Martinez-Trinidad, Jose Arturo Olvera Lopez, Kim L. Boyer
  • No of Pages: 346 Pages
  • Publisher: Springer
  • Publishing Date: June 14, 2012
  • Language: English
  • ISBN -10: 1603274308
  • ISBN -13: 978-3642311482
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